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Analytical TEM including combination of EDX and EELS analyses provides а complex information on morphology, elements distribution of metal-semiconductor nanocomposites. For the Au/WS2 and Au/MoS2 nanocomposites, the analytical TEM is the most informative and illustrative tool to confirm the formation of pure metallic nanoparticles on the surface of nanostructured disulphides. With the use of analytical TEM, it is possible to obtain optical EELS spectra. The comparison of optical properties measured on macro-samples (e.g. absorption spectra, diffuse reflectance spectra) and local EELS spectra set helps deeper understanding the optoelectronic properties of nanocomposites. Acknowledgments: M.V.Lomonosov Moscow State University Program of Development for support.