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We report on near-field mapping of higher order optical modes in all-dielectric nanoantennas (rod, disk, square, triangle shape) by using aperture type scanning near-field optical microscopy (SNOM). Nanoantennas have been made of amorphous Si on the glass substrate. The correspondence of the electromagnetic field components of the excited optical modes with features on SNOM maps is demonstrated by means of full 3D FDTD modeling of the scanning process.