ИСТИНА

Infrared spectroscopy and microscopy are basic techniques for organic and hybrid materials characterization. However, application of these methods to the nanostructured materials is limited by their spatial resolution. This disadvantage can be overcome by using a rapidly developing method of apertureless scanning near-field microscopy (s-SNOM). This method has been successfully used by us to study photochemical, electrochemical and radiation-induced degradation processes of organic and hybrid lead halides films with nanometer spatial resolution, the distribution of organic molecular modifiers in perovskite films, film uniformity of promising electron- and hole-transport layers.