Self-trapping of the d-d charge transfer exciton in bulk NiO evidenced by X-ray excited luminescenceстатья
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Дата последнего поиска статьи во внешних источниках: 18 июля 2013 г.
Аннотация:Soft Xray (XUV) excitation did make it possible to avoid the predominant role of the surface effects in luminescence of NiO and revealed a bulk luminescence with a puzzling well isolated doublet of very narrow lines with close energies near 3.3 eV which is assigned to recombination transitions in self-trapped d–d charge transfer (CT) excitons formed by coupled Jahn–Teller Ni+ and Ni3+ centers. The conclusion is supported both by a comparative analysis of the CT luminescence spectra for NiO and solid solutions NixZn1 – xO, and
by a comprehensive cluster model assignment of different p–d and d–d CT transitions, their relaxation channels. To the best of our knowledge, it is the first observation of the luminescence due to self-trapped d–d CT excitons.