Detecting gold in semiconducting advanced nanomaterials based on tin oxide via total reflection X-ray fluorescence analysisстатья
Информация о цитировании статьи получена из
Scopus
Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 29 февраля 2016 г.
Аннотация:A novel approach to detecting gold in tin dioxide advanced nanomaterials via total reflection X-ray fluorescence analysis (TRXF) is proposed. Data of gold and tin detection acquired via the nonstandard method for powders and with the use of an internal standard technique in aqueous suspensions are compared. Accuracy of the gold detection in powder nanomaterials via TRXF without sample decomposition is shown.