Аннотация:Inclusions in natural (38 samples) and artificial (8 samples) diamonds have been examined with the following methods: X-ray computer micro tomography (XCMT), Raman spectroscopy, Secondary X-ray fluorescence spectroscopy (SXFS) and micro-beam analyses.
The theoretic x-ray density (=sample/etalon) was calculated and several groups of the inclusions in diamond were established with the XCMT (GEOTOM, Yakushina) according to their x-ray absorption: 8-12 – metals; 6-7,5 – sulphides; 4-5,5 – oxides; 1-4,0 – silicates and 0,5 – carbon.
The comparison of the results show, that the X-ray computer micro tomography (XCMT) is a very effective method of the investigation of the inclusions in diamond and we can diagnose the natural and artificial diamonds without their cracking and polishing.