Near-field probing of Bloch surface waves in a dielectric multilayer using photonic force microscopyстатья
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Дата последнего поиска статьи во внешних источниках: 1 августа 2016 г.
Аннотация:The potential of photonic force microscopy (PFM) for probing the optical near-field in the vicinity of a dielectric
multilayer is demonstrated. An experimental study of Bloch surface waves (BSWs) using PFM is described in
detail. The applied technique is based on measuring the BSW-induced gradient force acting on a probe particle
combined with precise control of the distance between the particle and the multilayer surface. The BSW-induced
potential profile measured using PFM is presented. The force interaction between the probe and the BSW evanescent
field is numerically studied. The results indicate that a polystyrene particle with a diameter of 1 μm does
not significantly perturb the BSW field and can be used to probe the optical near-field intensity in an elegant,
noninvasive manner.