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An EFSM-Driven and Model Checking-Based Approach to Functional Test Generation for Hardware Designsстатья
- Авторы: Kamkin A., Lebedev M., Smolov S.
- Сборник: Proceedings of East-West Design & Test Symposium
- Год издания: 2016
- DOI: 10.1109/EWDTS.2016.7807736
- Аннотация: This paper describes a model-based functional test generation method for hardware designs. The main principles are as follows. Two models are extracted from an HDL description: a functional model, which represents the design under scrutiny, and a coverage model, which represents a set of testing goals. Each goal is specified in the negative form to force a model checker to find a counterexample — an execution of the functional model that violates the given property, and thus reaches the testing goal. The coverage criterion is defined on top of extended finite state machines derived from a design's source code. Experiments have shown the method flexibility and effectiveness.
- Добавил в систему: Камкин Александр Сергеевич