Approximate boundary conditions for the problem of calculating optical coefficients of ultrathin metallic films in the microwave and terahertz ranges

Glazunov, P.S.; Vdovin, V.A.; Andreev, V.G.

Авторы: Glazunov P.S., Vdovin V.A., Andreev V.G.
Журнал: Optics and Spectroscopy (English translation of Optika i Spektroskopiya)
Том: 128
Номер: 9
Год издания: 2020
Издательство: Optical Society of America
Местоположение издательства: United States
Первая страница: 1439
Последняя страница: 1448
DOI: 10.1134/S0030400X2009009X
Аннотация: We report on the approximate boundary conditions obtained for the problem of calculating theoptical coefficients of a system consisting of a dielectric substrate and an inhomogeneous ultrathin metallic film with an arbitrary thickness dependence of the conductivity deposited onto this substrate. The boundary conditions have been derived on the basis of the Picard’s method of successive approximations. Analyticalexpressions for estimating the error of the calculation of the optical coefficients obtained using the proposed approximate boundary conditions are presented. It is shown that the error increases with frequency and film thickness. The maximum error for 10-nm-thick films is no larger than 10.7% at a frequency of 1 THz. As an example, the complex optical coefficients of a system like the Fabry‒Perót etalon and a metallic film withouta substrate with the model thickness dependence of the conductivity have been calculated. The coincidence of the results of the calculations performed by the numerical simulation and using the approximate boundary conditions is shown. The possibility of direct calculation of the average conductivity of a film using the experimentalreflectance and transmittance is demonstrated.
Добавил в систему: Андреев Валерий Георгиевич

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Approximate boundary conditions for the problem of calculating optical coefficients of ultrathin metallic films in the microwave and terahertz rangesстатья

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