Structural studies of ZnS:Cu (5 at %) nanocomposites in porous Al2O3 of different thicknesses

Valeev, R.G.; Trigub, A.L.; Chukavin, A.I.; Beltiukov, A.N.

Информация о цитировании статьи получена из Web of Science, Scopus
Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 24 мая 2017 г.

Авторы: Valeev R.G., Trigub A.L., Chukavin A.I., Beltiukov A.N.
Журнал: Semiconductors
Том: 51
Номер: 2
Год издания: 2017
Издательство: Springer
Местоположение издательства: New York
Первая страница: 207
Последняя страница: 212
DOI: 10.1134/s1063782617020221
Аннотация: We present EXAFS, XANES, and X-ray diffraction data on nanoscale ZnS:Cu (5 at %) structures fabricated by the thermal deposition of a ZnS and Cu powder mixture in porous anodic alumina matrices with a pore diameter of 80 nm and thicknesses of 1, 3, and 5 μm. The results obtained are compared with data on ZnS:Cu films deposited onto a polycor surface. According to X-ray diffraction data, the samples contain copper and zinc compounds with sulfur (Cu2S and ZnS, respectively); the ZnS compound is in the cubic (sphalerite) and hexagonal (wurtzite) modifications. EXAFS and XANES studies at the K absorption edges of zinc and copper showed that, in samples deposited onto polycor and alumina with thicknesses of 3 and 5 μm, most copper atoms form the Cu2S compound, while, in the sample deposited onto a 1-μm-thick alumina layer, copper atoms form metallic particles on the sample surface. Copper crystals affect the Zn–S interatomic distance in the sample with a 1-μm-thick porous Al2O3 layer; this distance is smaller than in the other samples.
Добавил в систему: Валеев Ришат Галеевич

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Structural studies of ZnS:Cu (5 at %) nanocomposites in porous Al2O3 of different thicknessesстатья

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