Аннотация:Coherent reflection imaging at slant and grazing angles attracted attention during past years (Fenter et al., J Synchrotron Rad 15:558–571 2008; Marathe et al., Opt Express 18:7253–7262 2010; Roy et al., Nat Photonics 5:243–245 2011; Sun et al., J Nat Photon 6:586–590 2012; Gardner et al., Opt Express 20:19050–19059 2012; Zürch, Opt Express 21(18):21131–21147, 2013; Zhang et al., Extended reflection coherent diffraction imaging of nanostructures on a tabletop, Bulletin of the American Physical Society, APS March Meeting: Vol. 59, number 1, Monday–Friday, March 3–7, 2014, Denver). It is a new imaging technology allowing X-ray study of near surface layers of thick and opaque samples or nanostructures and thin samples fixed on a reflecting substrate. This work develops diffraction theory and calculations relevant to coherent reflection imaging of tilted objects illuminated below critical angles of X-ray reflection.