A Cryosystem for Cooling Samples in a Secondary Ion Mass Spectrometer with a Static Analyzer INSTRUMENTSстатья
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Дата последнего поиска статьи во внешних источниках: 19 сентября 2015 г.
Аннотация:A cryogenic system for cooling samples in an IMS-4F secondary-ion mass spectrometer with a static analyzer is described. The cryogenic system allows maintenance of the sample temperature with an accuracy of ±1 K in a temperature range of 60–420 K by combining heating and cooling (by using liquid helium or nitrogen). The effect of the sample temperature (300 and 110 K) on the secondary-ion mass spectra of Si and GaAs samples is considered.