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Статьи в сборниках
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- 1999 Nanoscale Level Studying of AlN Thin Film Growth with Help of Small-Angle Scattering of X-Ray Method
- Boiko M.E., Sher E.M.
- в сборнике Nitrides of Ga, In, Al: Structures & Devices. 3-rd All Russia Workshop, серия Abstracts, место издания Moscow