–
Статьи в журналах
-
- 2019 Photoluminescence properties and characterization of LiF-based imaging detector irradiated by 10 keV XFEL beam
- Bonfigli Francesca, Hartley Nickolas, Inubushi Yuichi, Koenig M., Matsuoka Takeshi, Makarov S., Montereali R.M., Nichelatti E., Ozaki N., Piccinini M., Pikuz S., Pikuz Tatiana A., Sagae Daisuke, Vincenti M.A., Yabashi Makina, Yabuuchi Toshinori
- в журнале Proceedings of SPIE - The International Society for Optical Engineering, издательство SPIE, the International Society for Optical Engineering (Bellingham, WA, United States), № 11035