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Статьи в журналах
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- 2013 Study of substrate orientations impact on Ultra Thin Buried Oxide (UTBOX) FDSOI High-K Metal gate technology performances
- Ben Akkez Imed, Fenouillet-Beranger Claire, Cros Antoine, Perreau Pierre, Haendler Sébatien, Weber Olivier, Andrieu François, Pellissier-Tanon D., Abbate F., Richard C., Beneyton R., Gouraud P., Margain A., Borowiak C., Gourvest E., Bourdelle K.K., Nguyen B.Y., Poiroux T., Skotnicki Thomas, Faynot Olivier, Balestra Francis, Ghibaudo Gérard, Boeuf Fréderic
- в журнале Solid-State Electronics, издательство Pergamon Press Ltd. (United Kingdom), том 90, с. 143-148 DOI