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Статьи в сборниках
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- 2017 Effect of etching on exchange bias in CoFe/IrMn bilayers studied by soft X-ray XMCD and resonant magnetic reflectometry
- O'Donnell D., Smekhova A., Wende H., Fan R., Steadman P., Du Y., Hassan S., Dobrynin A.
- в сборнике 2017 IEEE International Magnetics Conference (INTERMAG), место издания IEEE DOI