ИСТИНА

The International Symposium on Design and Diagnostics of Electronic Circuits and Systems provides a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems. The DDECS Symposium series has been organized by these European countries: Hungary (2001, 2005, 2018), Austria (2010), Germany (2011,2017), Estonia (2012), Czech Republic (1997, 2002, 2006, 2009, 2013), Poland (1998, 2003, 2007, 2014), Serbia (2015) and Slovakia (2000, 2004, 2008, 2016). DDECS’19 covers the areas of design and testing of electronic components, both digital and analog. The topics include the following but are not limited to: SoC and NoC Design and Test ASIC/FPGA Design Built-in Self-Test and Self-Repair Bio-Inspired Hardware Design Verification/Validation Formal Methods in System Design Hardware/Software Co-Design IP-based Design Logic Synthesis Modeling, circuit design and test for emerging technologies-based data storage/memory Modeling, circuit design and test for emerging technologies-based computation structures Defect/Fault Tolerance and Reliability Design and Test in Nano-Technologies Analog, Mixed-Signal, RF Design and Test ATE Hardware and Software Design for Testability and Diagnosis Embedded Systems Dependable HW / SW Systems On-line Testing Memory, Processor Testing MEMS Testing Physical Design Cyber Physical Systems Industry 4.0 Embedded Machine Learning Self-Aware Systems Design and Test Unconventional Computing Paradigms Emerging technologies-based logic design, test and reliability Internet-of-Things Design and Test Case Studies and Applications Functional Safety Reliability testing Hardware Security and Trust Security Primitives Hardware Trojans Fault and Side-Channel Attacks and Countermeasures Hardware Security and Emerging Technologies